Test set

Results: 814



#Item
141Standards / Educational psychology / Knowledge / Documents / Technical standard / Test / Education / Evaluation / Technical communication

Tennessee students need your input Tennessee’s academic standards, now in their fourth year, set higher expectations for Tennessee schools, and students in this state are now the fastest improving on the 2013 Nation’

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Source URL: expectmoretn.org

Language: English - Date: 2015-04-23 11:56:30
142Microcontrollers / Instruction set architectures / AVR32 / Embedded systems / Build automation / Compiling tools / Atmel / Make / Joint Test Action Group / Computer architecture / Computing / Electronics

EXTWIFI + EVK Quick Start Guide External Software Framework with AVR Studio 5 1 Introduction

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Source URL: www.hdwireless.se

Language: English - Date: 2015-03-24 12:56:52
143Electronic test equipment / Technology / Dvm / Voltmeter / Voltage / Resistor / Capacitor / High voltage / Electromagnetism / Physics / Measuring instruments

Digital Voltmeter & Phasing Set with Capacitive Test Point Mode HD Electric Company’s NEW DVM-80T Digital Voltmeter & Phasing Set with Capacitive Test Point Mode is a new addition to our Digital Voltmeter line. This c

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Source URL: www.hdelectriccompany.com

Language: English - Date: 2015-02-19 14:25:37
144Analysis of algorithms / Computational complexity theory / Probabilistic complexity theory / Randomized algorithm / Algorithm / Complexity / Consensus / Adversary model / In-place algorithm / Theoretical computer science / Applied mathematics / Mathematics

Fast Randomized Test-and-Set and Renaming Dan Alistarh1 , Hagit Attiya1,2 , Seth Gilbert1 , Andrei Giurgiu1 , and Rachid Guerraoui1 1 Ecole Polytechnique F´ed´erale de Lausanne, Lausanne, Switzerland 2

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Source URL: www.comp.nus.edu.sg

Language: English - Date: 2011-11-17 23:45:01
145Acorn Computers / Electronic engineering / ARM architecture / Instruction set architectures / Microcontroller / ARM Holdings / Joint Test Action Group / Computer architecture / Embedded systems / Electronics

GSG-STELLARISKRVMDK-ARM Getting Started Guide 750 Naples Street •

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Source URL: www.pumpkininc.com

Language: English - Date: 2011-09-12 16:19:08
146Learning / Regression analysis / Pattern recognition / Supervised learning / Semi-supervised learning / Training set / Manifold alignment / Test set / Linear regression / Statistics / Machine learning / Artificial intelligence

From Semi-Supervised to Transfer Counting of Crowds Chen Change Loy1 , Shaogang Gong2 , Tao Xiang2 1 Dept. of Information Engineering, The Chinese University of Hong Kong 2 School of EECS, Queen Mary University of London

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Source URL: personal.ie.cuhk.edu.hk

Language: English - Date: 2013-11-20 00:56:21
147Overfitting / Grid search / Support vector machine / Test set / Model selection / Training set / Parameter / Economic model / Statistics / Machine learning / Cross-validation

Chapter 16 Strategy Optimisation In prior chapters we have considered how to create both an underlying predictive model (such as with the Suppor Vector Machine and Random Forest Classifier) as well as a trading strategy

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Source URL: www.quantstart.com

Language: English - Date: 2015-05-18 04:58:44
148Computer engineering / Instruction set architectures / Acorn Computers / Embedded systems / ARM architecture / Joint Test Action Group / Control register / Coprocessor / Addressing mode / Computer architecture / Computing / Central processing unit

ARM7TDMI (Rev 3) Technical Reference Manual Copyright © All rights reserved.

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Source URL: www.embedded-it.de

Language: English - Date: 2010-09-23 10:49:43
149IEEE standards / Embedded systems / Electronics manufacturing / Joint Test Action Group / Microcontrollers / Instruction set architectures / ARM architecture / X86 debug register / Nexus / Electronics / Computing / Computer architecture

_ V9Technical Notes

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Source URL: www.isystem.com

Language: English - Date: 2015-05-27 07:21:02
150Electronic test equipment / Generating set / Web 2.0 / Signal generator / Seventh Sanctum / Computing / Hypertext / Generator

Microsoft Word - c2-losh3.doc

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Source URL: eee.uci.edu

Language: English - Date: 2009-04-06 03:52:22
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